1.

Conference Proceedings

Conference Proceedings
Hayashi,K. ; Ohta,E. ; Wada,H.
Pub. info.: Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA.  pp.160-167,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4454
2.

Conference Proceedings

Conference Proceedings
Wada,H. ; Nagashima,M. ; Hayashi,K. ; Nakanishi,J. ; Kimata,M. ; Kumada,N. ; Ito,S.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.584-595,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
3.

Conference Proceedings

Conference Proceedings
Inouye,Y. ; Hayazawa,N. ; Hayashi,K. ; Sekkat,Z. ; kawata,S.
Pub. info.: Near-field optics : physics, devices, and information processing : 22-23 July 1999, Denver, Colorado.  pp.40-48,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3791
4.

Conference Proceedings

Conference Proceedings
Nagashige,S. ; Hayashi,K. ; Akima,S. ; Takahashi,H. ; Chiba,K. ; Yamada,Y. ; Matsuzawa,Y.
Pub. info.: 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California.  Part1  pp.127-137,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3873
5.

Conference Proceedings

Conference Proceedings
Kawano,Y. ; Abe,C. ; Abe,K. ; Hayashi,K. ; Hatta,Y. ; Tamura,Y.
Pub. info.: Current developments in lens design and optical systems engineering : 2-4 August 2000, San Diego, USA.  pp.288-296,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4093
6.

Conference Proceedings

Conference Proceedings
Watanabe,W. ; Toma,T. ; Yamada,K. ; Nishii,J. ; Hayashi,K. ; Itoh,K.
Pub. info.: First International Symposium on Laser Precision Microfabrication : 14-16 June 2000, Omiya, Saitama, Japan.  pp.44-47,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4088
7.

Conference Proceedings

Conference Proceedings
Itoh,K. ; Watanabe,W. ; Yamada,K. ; Hayashi,K. ; Nishii,J.
Pub. info.: Photorefractive fiber and crystal devices : materials, optical properties, and applications VII, and optical data storage : 29-31 July 2001, San Diego, USA.  pp.118-125,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4459
8.

Conference Proceedings

Conference Proceedings
Sato,M. ; Ando,N. ; Ozawa,S. ; Miki,H. ; Hayashi,K. ; Kitajima,M.
Pub. info.: Porous materials for tissue engineering.  pp.105-114,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 250
9.

Conference Proceedings

Conference Proceedings
Hayashi,K. ; Yamamoto,T. ; Ikuhara,Y. ; Sakuma,T.
Pub. info.: Intergranular and interphase boundaries in materials : iib98 : proceedings of the 9th International Conference on Intergranular and Interphase Boundaries in Materials (iib98), held in Prague, Czech Republic, July, 1998.  pp.711-714,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 294-296
10.

Conference Proceedings

Conference Proceedings
Hayashi,K. ; Sekiguchi,T. ; Okushi,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.745-750,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263