1.

Conference Proceedings
Conference Proceedings
1. ANNEALING OF DEFECTS DURING THE DEPOSITION OF AMORPHOUS SILICON
Hata, N. ; Cabarrocas, i Roca, P. ; Wyrsch, N. ; Wagner, S. ; Favre, M.
Pub. info.: Amorphous silicon technology, 1990 : symposium held April 17-20, 1990, San Francisco, California, U.S.A..  pp.615-620,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 192
2.

Conference Proceedings
Conference Proceedings
2. DEPENDENCE OF STEADY-STATE DEFECT DENSITY IN HYDROGENATED AMORPHOUS SILICON ON CARRIER GENERATION RATE STUDIED OVER A WIDE RANGE
Hata, N. ; Ganguly, G. ; Matsuda, A.
Pub. info.: Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A..  pp.577-582,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 297
3.

Conference Proceedings
Conference Proceedings
3. Photorefractive nanocrystalline silicon: materials, science, and application (Invited Paper)
Fortmann, C.M. ; Mahan, A.H. ; Anderson, W.A. ; Tonucci, R.J. ; Hata, N.
Pub. info.: Optical information processing technology : 16-18 October 2002, Shanghai, China.  pp.312-322,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4929
4.

Conference Proceedings
Conference Proceedings
4. TEMPERATURE DEPENDENCE OF THE GROWTH AND SATURATION OF LIGHT-INDUCED DEFECTS IN a-Si:H
Isomura, M. ; Hata, N. ; Wagner, S.
Pub. info.: Amorphous silicon technology 1991 : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.27-32,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 219
5.

Conference Proceedings
Conference Proceedings
5. A COMPREHENSIVE DEFECT MODEL FOR AMORPHOUS SILICON
Hata, N. ; Larson, E. ; Liu, J,. Z. ; Okada, Y. ; Park, H. R. ; Wagner, S.
Pub. info.: Amorphous silicon technology, 1990 : symposium held April 17-20, 1990, San Francisco, California, U.S.A..  pp.285-292,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 192
6.

Conference Proceedings
Conference Proceedings
6. Real-time 3D-image-guided navigation system based on integral videography
Liao. H. ; Nakajima, S. ; Iwahara, M. ; Hata, N. ; Sakuma, I. ; Dohi, T.
Pub. info.: Biomedical diagnostic, guidance, and surgical-assist systems IV : 20-21 January 2002, San Jose, USA.  pp.36-44,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4615
7.

Conference Proceedings
Conference Proceedings
7. Light-Induced Degradation Effects in a-Si:H Observed by Raman Scattering Measurements
Stradins, P. ; Kondo, M. ; Hata, N. ; Matsuda, A.
Pub. info.: Amorphous and microcrystalline silicon technology - 1998 : symposium held April 14-17, 1998, San Francisco, California, U.S.A..  pp.723-,  1999.  Warrendale.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 507
8.

Conference Proceedings
Conference Proceedings
8. Plasma Deposition and Characterization of Stable a-Si:H(Cl) from a Silane-Dichlorosilane Mixture
Osborne, I. S. ; Hata, N. ; Matsuda, A.
Pub. info.: Amorphous silicon technology, 1995 : Symposium held April 18-21, 1995, San Francisco, California, U.S.A..  pp.113-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 377
9.

Conference Proceedings
Conference Proceedings
9. A New Approach Of Thin-Film X-Ray Diffraction / Scattering Analysis For Ultra-Low-K Dielectrics With Periodic Pore Structures
Hata, N. ; Oku, Y. ; Yamada, K. ; Kikkawa, T.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.581-586,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
10.

Conference Proceedings
Conference Proceedings
10. THE DISTRIBUTION OF OCCUPIED DEEP LEVELS IN a-Si:H DETERMINED FROM CPM SPECTRA
Hata, N. ; Wagner, S.
Pub. info.: Amorphous silicon technology 1991 : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.611-618,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 219