1.

Conference Proceedings
Conference Proceedings
1. Control of Variation of Time Delay from Ignition to Launch in ETC Gun
Akahoshi, Y. ; Matsuda, E. ; Hata, H.
Pub. info.: Explosion, shock wave and hypervelocity phenomena in materials : proceedings of the 1st International Symposium on Explosion, Shock Wave and Hypervelocity Phenomena in Materials(ESHP Symposium), 15-17 March 2004, Kumamoto, Japan.  pp.185-188,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 465-466
2.

Conference Proceedings
Conference Proceedings
2. Structure, Composition and Properties of (Pb,La)TiO3 Thin Films by RF Magnetron Sputtering
Murphy, C. E. ; Hata, H. ; Tsutsumi, K.
Pub. info.: Ferroelectric thin films V : symposium held April 7-12, 1996, San Francisco, California, U.S.A..  pp.389-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 433
3.

Technical Paper
Technical Paper
3. Development of a New Hybrid Transmission for FWD Sports Utility Vehicles.
Hata, H. ; Kojima, M. ; Watanabe, H. ; Mizutani, T. ; Kamiya, M.
Pub. info.: 2005 SAE world congress : technical paper.  2005.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2005
4.

Conference Proceedings
Conference Proceedings
4. Development status of a 193-nm immersion exposure tool [6154-68]
Chibana, T. ; Nakano, H. ; Hata, H. ; Kodachi, N. ; Sano N ; Arakawa, M. ; Matsuoka, Y. ; Kawasaki, Y. ; Mori, S. ; Chiba, K.
Pub. info.: Optical Microlithography XIX.  pp.61541V-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
5.

Conference Proceedings
Conference Proceedings
5. System design of a 157-nm scanner
Nogawa, H. ; Hata, H. ; Kohno, M.
Pub. info.: Optical Microlithography XV.  Part One  pp.602-612,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4691
6.

Conference Proceedings
Conference Proceedings
6. Development status of a 157-nm full-field scanner
Nakano, H. ; Hata, H. ; Nogawa, H. ; Deguchi, N. ; Kohno, M. ; Chiba, Y.
Pub. info.: Optical Microlithography XVI.  Part Two  pp.763-771,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
7.

Conference Proceedings
Conference Proceedings
7. Pixel scaling for SOI-diode uncooled infrared focal plane arrays
Kosasayama, Y. ; Sugino, T. ; Nakaki, Y. ; Fujii, Y. ; Inoue, H. ; Yagi, H. ; Hata, H. ; Ueno, M. ; Takeda, M. ; Kimata, M.
Pub. info.: Infrared Technology and Applications XXX.  pp.504-511,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5406
8.

Conference Proceedings
Conference Proceedings
8. Development of 157-nm full-field scanners
Hata, H. ; Nogawa, H. ; Suda, S.
Pub. info.: Optical Microlithography XVII.  pp.806-815,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
9.

Conference Proceedings
Conference Proceedings
9. Evaluation systems of F2 laser lithography materials
Itakura, Y. ; Kawasa, Y. ; Egawa, K. ; Sumitani, A. ; Sasaki, H. ; Higasikawa, I. ; Irie, S. ; Fujii, K. ; Itani, T. ; Nakano, H. ; Hata, H.
Pub. info.: Optical Microlithography XVII.  pp.1606-1615,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377