1.

Conference Proceedings
Conference Proceedings
1. Advanced industrial metrology used for qualification of high-quality optical materials
Engel, A. ; Westenberger, G. ; Bartelmess, L. ; Sohr, O. ; Haspel, R. ; Moersen, E.
Pub. info.: Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA.  pp.117-124,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4779
2.

Conference Proceedings
Conference Proceedings
2. Advanced industrial fluorescence metrology used for qualification of high quality optical materials
Engel, A. ; Becker, H.-J. ; Sohr, O. ; Haspel, R. ; Rupertus, V.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.182-189,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5188
3.

Conference Proceedings
Conference Proceedings
3. Results of a round-robin experiment on reflectivity measurements at a wavelength of 1.06 μm
Nickel, D. ; Fleig, C. ; Erhard, A. ; Letsch, A. ; Giesen, A. ; Jupe, M. ; Starke, K. ; Ristau, D. ; Wilhelm, O. ; Huber, R.A. ; Haspel, R. ; Schuhmann, U. ; Scharfenorth, C. ; Eichler, H.J. ; Gliech, S. ; Duparre, A. ; Schulz-Grosser, M. ; Krasilnikova, A. ; Haise, A. ; Riede, W. ; Balachninaite, O. ; Grigonis, R. ; Sirutkaitis, V. ; Kazakevich, V.
Pub. info.: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.520-526,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4932
4.

Conference Proceedings
Conference Proceedings
4. Fluorescence metrology used for analysis of high-quality optical materials
Engel, A. ; Haspel, R. ; Rupertus, V.
Pub. info.: Optical Metrology in Production Engineering.  pp.65-73,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5457