1.

Conference Proceedings
Conference Proceedings
1. Nonlinear Dielectric Properties of Anodic Alumina Films
Alwitt, R.S. ; Hasebe, T.
Pub. info.: Oxide Films : proceedings of the International Symposium.  pp.283-293,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-4
2.

Conference Proceedings
Conference Proceedings
2. Introduction of a die-to-database verification tool for the entire printed geometry of a die: geometry verification system NGR2100 for DFM
Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Sakai, F. ; Nakazawa, S. ; Vohra, N. ; Yamamoto, M. ; Inoue, M.
Pub. info.: Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA.  pp.73-84,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5756
3.

Conference Proceedings
Conference Proceedings
3. Design of Impact Energy Characteristics of FRP Deep-Drawn Structures
Mizukami, K. ; Hasebe, T. ; Katayama, T. ; Nakamura, Y. ; Imaida, Y.
Pub. info.: Explosion, shock wave and hypervelocity phenomena in materials : proceedings of the 1st International Symposium on Explosion, Shock Wave and Hypervelocity Phenomena in Materials(ESHP Symposium), 15-17 March 2004, Kumamoto, Japan.  pp.43-48,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 465-466
4.

Conference Proceedings
Conference Proceedings
4. Technology mapping technique for throughput enhancement of character projection equipment [6151-36]
Sugihara, M. ; Takata, T. ; Nakamura, K. ; Inanami, R. ; Hayashi, H. ; Kishimoto, K. ; Hasebe, T. ; Kawano, Y. ; Matsunaga, Y. ; Murakami, K. ; Okumura, K.
Pub. info.: Emerging Lithographic Technologies X.  pp.61510Z-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6151
5.

Conference Proceedings
Conference Proceedings
5. Introduction of a die-to-database verification tool for mask geometry NGR4000 [6349-150]
Hoffman, M. J. ; Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Nakazawa, S. ; Tokumoto, T. ; Tsuneoka, M. ; Yamamoto, M. ; lnoue, M.
Pub. info.: Photomask Technology 2006.  pp.634940-634940,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
6.

Conference Proceedings
Conference Proceedings
6. Direct die-to-database electron-beam inspection of fused silica imprint templates [6349-86]
Tsuneoka, M. ; Hasebe, T. ; Tokumoto, T. ; Yan, C. ; Yamamoto, M. ; Resnick, D. J. ; Thompson, E. ; Wakamori, H. ; lnoue, M. ; Ainley, E. ; Nordquist, K. J. ; Dauksher, W. J.
Pub. info.: Photomask Technology 2006.  pp.63492D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
7.

Conference Proceedings
Conference Proceedings
7. Introduction of a die-to-database verification tool for the entire printed geometry of a die: geometry verification system NGR2100 for DFM [5853-88]
Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Sakai, F. ; Nakazawa, S. ; Vohra, N. ; Yamamoto, M. ; Inoue, M.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.988-999,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853