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Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.789-797, 1998. Pennington, NJ. Electrochemical Society
Landau, S. A. ; Weiss, P-A. ; Junghans, N. ; Kolbesen, B. O. ; Adderton, D. ; Schindler, G. ; Hartner, W. ; Hintermaier, F. ; Dehm, C. ; Mazure, C.
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Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A.. pp.567-, 1999. Warrendale, PA. MRS - Materials Research Society
Grossmann, M. ; Lohse, O. ; Bolten, D. ; Waser, R. ; Hartner, W. ; Schindler, G. ; Nagel, N. ; Dehm, C.
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Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.269-, 1999. Warrendale, PA. MRS - Materials Research Society
Lohse, O. ; Bolten, D. ; Grossmann, M. ; Waser, R. ; Hartner, W. ; Schindler, G.
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Ferroelectric thin films VI : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A.. pp.267-, 1998. Pittsburgh, Pa.. MRS - Materials Research Society
Jekauc, I. ; Gould, C.J. ; Hartner, W. ; Urenda, T.
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Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA. pp.116-123, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering