1.

Conference Proceedings
Conference Proceedings
1. ALMA front-end optics
Carter, M. C. ; Baryshev, A. ; Harman, M. ; Lazareff, B. ; Lamb, J. ; Navarro, S. ; John, D. ; Fontana, A. -L. ; Ediss, G. A. ; Tham, C. Y. ; Withington, S. ; Tercero, F. ; Nesti, R. ; Tan, G. H. ; Sekimoto, Y. ; Matsunaga, M. ; Ogawa, H. ; Claude, S.
Pub. info.: Ground-based telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.1074-1084,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5489
2.

Conference Proceedings
Conference Proceedings
2. New cryogenic heterodyne techniques applied in TELIS: the balloon-borne THz and submillimeter limb sounder for atmospheric research
Hoogeveen, R.W.M. ; Yagoubov, P.A. ; Maurellis, A. ; Koshelets, V.P. ; Shitov, S.V. ; Mair, U. ; Krocka, M. ; Wagner, G. ; Birk, M. ; Huebers, H.-W. ; Richter, H. ; Semenov, A. ; Gol'tsman, G.N. ; Voronov, B.M. ; Ellison, B.N. ; Kerridge, B.J. ; Matheson, D.N. ; Alderman, B. ; Harman, M. ; Siddans, R. ; Reburn, J.
Pub. info.: Infrared spaceborne remote sensing XI : 6-8 August 2003, San Diego, California, USA.  pp.347-355,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5152
3.

Conference Proceedings
Conference Proceedings
3. High-resolution EUV Microstepper tool for resist testing and technology evaluation
Brunton, A. ; Cashmore, J.S. ; Elbourn, P. ; Elliner, G. ; Gower, M.C. ; Grunewald, P. ; Harman, M. ; Hough, S. ; McEntee, N. ; Mundair, S. ; Rees, D. ; Richards, P. ; Truffert, V. ; Wallhead, I. ; Whitfield, M.D.
Pub. info.: High-Power Laser Ablation V.  pp.681-692,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5448
4.

Conference Proceedings
Conference Proceedings
4. High-resolution EUV microstepper tool for resist testing and technology evaluation
Brunton, A. ; Cashmore, J. ; Elbourn, P. ; Elliner, G. ; Gower, M.C. ; Grunewald, P. ; Harman, M. ; Hough, S. ; McEntee, N. ; Mundair, S. ; Rees, D. ; Richards, P. ; Truffert, V. ; Wallhead, I. ; Whitfield, M.
Pub. info.: Emerging Lithographic Technologies VIII.  pp.869-880,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5374