1.

Conference Proceedings
Conference Proceedings
1. "Calibrated sensitive polarization measurement methods in the regions 3-5μm and 8-12μm, corrected for contributions to the detector signal from the polarizer"
Forssell,G. ; Hallberg,T.
Pub. info.: Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA.  pp.257-269,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4481
2.

Conference Proceedings
Conference Proceedings
2. Formation of Ultra Shallow Donors in Silicon by Long-Term-Annealing at 470 °C
Aberg,D. ; Hallberg,T. ; Svensson,B.G. ; Lindstrom,J.L. ; Kleverman,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.385-390,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Tbe oxygen dimer in silicon:some experimental observatiol's
Hallberg,T. ; Lindstrom,J.L. ; Murin,L.I. ; Markevich,V.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.361-366,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings
Conference Proceedings
4. Formation of Oxygen Dimers in Silicon during Electron-Irradiation Above 250 °C
Lindstrom,J.L. ; Hallberg,T. ; Aberg,D. ; Svensson,B.G. ; Murin,L.I. ; Markevich,V.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.367-372,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Annealing of Electron Irradiated P-,As-,Sb- and Bi-Doped Czochralski Silicon
Hallberg,T. ; Lindstrom,J.L. ; Svensson,B.G. ; Swiatek,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1239-1244,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147