Hassel, J. ; Seppa, H. ; Lindell, R. ; Hakonen, P.
Pub. info.:
Millimeter and submillimeter detectors for astronomy II : 23-25 June 2004, Glasgow, Scotland, United Kingdom. pp.818-825, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lindell, R. ; Delahaye, J. ; Sillanpaa, M. ; Paalanen, M. ; Sonin, E. ; Hakonen, P.
Pub. info.:
Noise and Information in Nanoelectronics, Sensors, and Standards II. pp.19-27, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering