1.

Conference Proceedings
Conference Proceedings
1. Electrical and optical characterizatiou of defects in GaN generated by ion implantation
Haase,D. ; Burkard,M. ; Schmid,M. ; Domen,A. ; Schweizer,H. ; Bolay,H. ; Scholz,F.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1093-1098,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. An Optical Zeeman Study on Fe3+ in GaAs and InP
Kaufmann,B. ; Haase,D. ; Dornen,A. ; Hiller,C. ; Pressel,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.797-802,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147