1.

Conference Proceedings

Conference Proceedings
J. Ge ; H. Chan ; B. Sahiner ; Y. Zhang ; J. Wei ; L. M. Hadjiiski ; C. Zhou
Pub. info.: Medical imaging 2007, Image processing : 18-20 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6512
2.

Conference Proceedings

Conference Proceedings
Y. Wu ; C. Zhou ; L. M. Hadjiiski ; J. Shi ; J. Wei ; C. Paramagul ; B. Sahiner ; H. Chan
Pub. info.: Medical imaging 2007, Image processing : 18-20 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6512
3.

Conference Proceedings

Conference Proceedings
C. Zhou ; H. Chan ; L. M. Hadjiiski ; A. Chughtai ; S. Patel ; P. N. Cascade ; B. Sahiner ; J. Wei ; J. Ge ; E. A. Kazerooni
Pub. info.: Medical imaging 2007, Computer-aided diagnosis : 20-22 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6514
4.

Conference Proceedings

Conference Proceedings
L. Hadjiiski ; T. W. Way ; B. Sahiner ; H. Chan ; P. Cascade ; N. Bogot ; E. Kazerooni ; C. Zhou
Pub. info.: Medical imaging 2007, Computer-aided diagnosis : 20-22 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6514
5.

Conference Proceedings

Conference Proceedings
J. Shi ; B. Sahiner ; H. Chan ; L. Hadjiiski ; C. Zhou ; Y. Wu ; J. Wei
Pub. info.: Medical imaging 2007, Computer-aided diagnosis : 20-22 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6514
6.

Conference Proceedings

Conference Proceedings
J. Wei ; B. Sahiner ; H. Chan ; L. M. Hadjiiski ; M. A. Roubidoux ; M. A. Helvie ; J. Ge ; C. Zhou ; Y. Wu
Pub. info.: Medical imaging 2007, Computer-aided diagnosis : 20-22 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6514
7.

Conference Proceedings

Conference Proceedings
B. Sahiner ; L. M. Hadjiiski ; H. Chan ; J. Shi ; T. Way ; P. N. Cascade ; E. A. Kazerooni ; C. Zhou ; J. Wei
Pub. info.: Medical imaging 2007, Computer-aided diagnosis : 20-22 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6514
8.

Conference Proceedings

Conference Proceedings
F. Yan ; S. Mok ; P. Lin ; H. Chan
Pub. info.: Thin Film Transistors 9.  pp.355-364,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(9)
9.

Conference Proceedings

Conference Proceedings
H. Chan ; J. Wei ; Y. Zhang ; R. H. Moore ; D. B. Kopans ; L. Hadjiiski ; B. Sahiner ; M. A. Roubidoux ; M. A. Helvie
Pub. info.: Medical imaging 2007, Computer-aided diagnosis : 20-22 February 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6514
10.

Conference Proceedings

Conference Proceedings
Y. Zhang ; H. Chan ; B. Sahiner ; J. Wei ; J. Ge ; L. M. Hadjiiski ; C. Zhou
Pub. info.: Medical Imaging 2007: Physics of Medical Imaging.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6510