1.

Conference Proceedings
Conference Proceedings
1. Charge Trapping: A Major Reliability Challenge for High-k Gate Dielectrics
T. Ma ; S. Wang ; L. Song ; H. Bu
Pub. info.: Physics and technology of high-k gate dielectrics III.  pp.733-744,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(5)
2.

Conference Proceedings
Conference Proceedings
2. The Impact of Carbon on the Warpage of e-SiGe Wafers During Laser Anneal
D.J. Riley ; H. Bu ; A. Jain ; R. Khamankar
Pub. info.: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.333-340,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(10)
3.

Academic Journal
Academic Journal
3. Identifying the origin and geochemical evolution of groundwater using hydrochemistry and stable isotopes in the Subei Lake basin, Ordos energy base, Northwestern China
F. Liu ; X. Song ; L. Yang ; Y. Zhang ; D. Han ; Y. Ma ; H. Bu
Pub. info.: Hydrology and earth system sciences.  19  (1),  pp.551-565,  2015.  Katlenburg-Lindau, Germany.  European Geophysical Society