1.

Conference Proceedings

Conference Proceedings
Guo,Y. ; Li,T.
Pub. info.: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  pp.14-19,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4537
2.

Conference Proceedings

Conference Proceedings
Cole,T.D. ; Zuber,M.T. ; Neuman,G. ; Cheng,A.F. ; Reiter,R.A. ; Guo,Y. ; Smith,D.E.
Pub. info.: Laser radar technology and applications VI : 17-19 April 2001, Orlando, USA.  pp.163-174,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4377
3.

Conference Proceedings

Conference Proceedings
Du,J. ; Su,J. ; Huang,Q. ; Zhang,Y. ; Guo,Y. ; Du,C. ; Cui,Z.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.348-351,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
4.

Conference Proceedings

Conference Proceedings
Du,J. ; Huang,Q. ; Guo,Y. ; Cui,Z.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.932-938,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
5.

Conference Proceedings

Conference Proceedings
Kuroda,R. ; Dow,G.S. ; Guo,Y. ; Johnson,R.L. ; Biedenbender,M. ; Marashi,A. ; Yujiri,L. ; Shoucri,M.
Pub. info.: Passive millimeter-wave imaging technology : 21-22 April 1997, Orlando, Florida.  pp.90-97,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3064
6.

Conference Proceedings

Conference Proceedings
Guo,Y. ; Su,J. ; Du,J. ; Huang,Q. ; Yao,J. ; Zhang,Y. ; Wei,X. ; Yuan,X. ; Yuan,J.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.161-167,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
7.

Conference Proceedings

Conference Proceedings
Du,J. ; Gao,F. ; Zhang,Y. ; Guo,Y. ; Du,C. ; Cui,Z.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part2  pp.1047-1052,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
8.

Conference Proceedings

Conference Proceedings
Guo,Y. ; Yin,X. ; Gong,W.
Pub. info.: Enabling technology for simulation science II : 14-16 April, 1998, Orlando, Florida.  pp.35-48,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3369
9.

Conference Proceedings

Conference Proceedings
Wang,Y. ; Yang,Y. ; Guo,Y. ; Gan,R. ; Wang,J. ; Sun,Y. ; Chen,G.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.104-107,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
10.

Conference Proceedings

Conference Proceedings
Yang,D. ; Wang,R. ; Xie,S. ; Guo,Y. ; Sun,Y. ; Fan,C. ; Da,D. ; Wang,H. ; Li,H.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.82-85,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175