Kallmeyer, F. ; Krueger, S. ; Wernicke, G.K. ; Gruber, H. ; Kayser, D.
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Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA. pp.251-260, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wernicke, G.W. ; Krueger, S. ; Gruber, H. ; Demoli, N. ; Duerr, M. ; Teiwes, S.
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Advanced photonic sensors and applications II : 27-30 November 2001, Singapore. pp.182-190, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wernicke, G.K. ; Kallmeyer, F. ; Krueger, S. ; Gruber, H. ; Kayser, D.
Pub. info.:
Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway. pp.218-225, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ndnyei, Z. ; Niess, J. ; Buschbaum, S. ; Meyer, K. ; Dieti, W. ; Berger, R. ; Miethaner, S. ; Gruber, H. ; Wahlich, R. ; Chamberlain, S.
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Rapid thermal and other short-time processing technologies III : proceedings of the international symposium. pp.261-272, 2002. Pennington, NJ. Electrochemical Society
Hermerschmidt, A. ; Wernicke, G. ; Kroger, S. ; Langner, A. ; Gruber, H. ; Durr, M.
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Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information. pp.62521J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering