1.

Conference Proceedings
Conference Proceedings
1. Defects in As-Prepared and Thermally Oxydized Porous Silicon
Bardeleben,H.J.von ; Grosman,A. ; Morazzani,V. ; Ortega,C. ; Siejka,J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1487-1491,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Electrical Characterization of Surface Defects on Porous p-type Silicon
Cadet,C. ; Deresmes,D. ; Vuillaume,D. ; Stievenard,D. ; Grosman,A. ; Ortega,C. ; Siejka,J. ; Bardeleben,H.J.von
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1475-1480,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Defect and structure analysis of n+and P+-type porous silicon by the Electron Paramagnetic Resonance Technique
von Bardeleben,H.J. ; Stievenard*,D. ; Grosman,A. ; Ortega,C. ; Siejka,J.
Pub. info.: Optical properties of low dimensional silicon structures.  pp.191-196,  1993.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 244