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Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA. pp.31-40, 2005. Bellingham, Washington. SPIE - The International Society of Optical Engineering
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Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA. pp.120-131, 2005. Bellingham, Washington. SPIE - The International Society of Optical Engineering
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Operational Characteristics and Crystal Growth of Nonlinear Optical Materials II. pp.591203-591204, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Operational Characteristics and Crystal Growth of Nonlinear Optical Materials II. pp.59120I-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering