1.

Conference Proceedings
Conference Proceedings
1. PALLADIUM-TEST: A TOOL TO EVALUATE GETTERING EFFICIENCY
Graff, K. ; Hefner, H. A. ; Pieper, H.
Pub. info.: Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A..  pp.19-24,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 36
2.

Conference Proceedings
Conference Proceedings
2. TEM STUDY OF METAL IMPURITY PRECIPITATES IN THE SURFACE REGIONS OF SILICON WAFERS
Seibt, M. ; Graff, K.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.215-218,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings
Conference Proceedings
3. Novel method to reduce the surface recombination velocity for the carrier lifetime measurement in silicon wafers
Arndt, W. ; Graff, K. ; Heim, P.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.44-53,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
4.

Conference Proceedings
Conference Proceedings
4. Techniques for metal contamination analysis and control
Graff, K.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.3-18,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30