1.

Conference Proceedings
Conference Proceedings
1. CHARISMA: a new way for angular-resolved scattering measurements
Apel,O. ; Gorling,C. ; Leinhos,U. ; Mann,K.R. ; Schafer,B.
Pub. info.: Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado.  pp.569-578,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4347
2.

Conference Proceedings
Conference Proceedings
2. Long-term test and characterization of optical components at 193 nm and 157 nm
Vogler,K. ; Klaft,I. ; Schroder,T. ; Stamm,U. ; Mann,K.R. ; Apel,O. ; Gorling,C. ; Leinhos,U.
Pub. info.: Inorganic optical materials II : 1-3 August, 2000, San Diego, USA.  pp.255-260,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4102
3.

Conference Proceedings
Conference Proceedings
3. Testing of optical components for microlithography at 193- and 157-nm
Mann,K.R. ; Apel,O. ; Eckert,G. ; Gorling,C. ; Leinhos,U. ; Schafer,B.
Pub. info.: Optical Microlithography XIV.  4346  pp.1340-1348,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4346