1.

Conference Proceedings
Conference Proceedings
1. Optical characterization of edge-emitting LEDs (EELEDs) for scanning display applications
Altendorf,E.H. ; Gong,T.J. ; Brown,M.K. ; Nissen,J.
Pub. info.: Solid state lighting and displays : 31 July-1 August 2001, San Diego, USA.  pp.111-118,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4445
2.

Conference Proceedings
Conference Proceedings
2. Measurement of the dynamic deformation of a high-frequency scanning mirror using a Shack-Hartmann wavefront sensor
Brown,M.K. ; Gong,T.J. ; Neal,D.R. ; Roller,J.P. ; Luanava,S. ; Urey,H.
Pub. info.: Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA.  pp.480-488,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4451