1.

Conference Proceedings
Conference Proceedings
1. Magnetic resonance of X-point shallow donors in AlSb:Te bulk crystals and AlSb MBE layers
Wilkening,W. ; Kaufmann,U. ; Schneider,J. ; Schonherr,E. ; Glaser,E.R. ; Shanabrook,B.V. ; Waterman,J.R. ; Wagner,R.J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.793-798,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings
Conference Proceedings
2. Optically-detected magnetic resonance studies of donor states in Al.Gal-xAs(x｡？.35)doped with group-IV and group-VI impurities
Glaser,E.R. ; Kennedy,T.A.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.775-786,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Engineered heterostructures of 6.1-A ?-V semiconductors for advanced electronic and optoelectronic applications
Shanabrook,B.V. ; Barvosa-Carter,W. ; Bass,R. ; Bennett,B.R. ; Boos,J.B. ; Bewley,W.W. ; Bracker,A.S. ; Culbertson,J.C. ; Glaser,E.R. ; Kruppa,W. ; Magno,R. ; Moore,W.J. ; Meyer,J.R. ; Nosho,B.Z. ; Thibado,P.M. ; Twigg,M.E. ; Wagner,R.J. ; Waterman,J.R. ; Whitman,L.J.
Pub. info.: Engineered nanostructural films and materials : 22-23 July 1999, Denver, Colorado.  pp.13-22,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3790
4.

Conference Proceedings
Conference Proceedings
4. Optical and Magnetic Resonance Studies of Defects in GaN
Glaser,E.R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.9-16,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Electron Paramagnetic Resonance of the Mn-Impurity in ZnS Nanocrystals
Kennedy,T.A. ; Glaser,E.R. ; Klein,P.B. ; Bhargava,R.N.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.737-742,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings
Conference Proceedings
6. Electrically and Optically Detected Magnetic Resonance Studies of GaN-Based Heterostructures
Carlos,W.E. ; Glaser,E.R. ; Kennedy,T.A. ; Nakamura,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.25-30,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
7.

Conference Proceedings
Conference Proceedings
7. Time-Resolved ODMR Measurements on the "Yellow Luminescence"in MOCVD-Grown GaN Films
Koschnick,F.K. ; Spaeth,J.-M. ; Glaser,E.R. ; Doverspike,K. ; Rowland,L.B. ; Gaskill,D.K. ; Wickenden,D.K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.37-42,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201