1.

Conference Proceedings
Conference Proceedings
1. The Role of Vacancies and Dopants in Si Solid-Phase Epitaxial Crystallization
Atwater, H. A. ; Chen, CM. ; Gessmann, T. ; Lynn, K. G. ; Petkov, M. P. ; Rassiga, S. ; Weber, M. H.
Pub. info.: Amorphous and heterogeneous silicon thin films : fundamentals to devices - 1999 : symposium held April 5-9, 1999, San Francisco, California, U.S.A..  pp.183-188,  1999.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 557
2.

Conference Proceedings
Conference Proceedings
2. Formation of Interfacial Voids in Aluminum by Oxidation and Dissolution Processes
Hebert, K.R. ; Gessmann, T. ; Lynn, K.G. ; Asoka-Kumar, P.
Pub. info.: Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium.  pp.469-479,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-25
3.

Conference Proceedings
Conference Proceedings
3. Performance characteristics of white light sources consisting of multiple light-emitting diodes
Li, Y.-L. ; Shah, J.M. ; Leung, P.-H. ; Gessmann, T. ; Schubert, E.F.
Pub. info.: Third international conference on solid state lighting : 5-7 August 2003, San Diego, California, USA.  pp.178-184,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5187
4.

Conference Proceedings
Conference Proceedings
4. Formation of Interfacial Defects by Anodic Oxidation of Aluminum
Huang, R. ; Hebert, K.R. ; Chumblev, L.S. ; Gessmann, T. ; Lynn, K.G.
Pub. info.: Surface oxide films : proceedings of the international symposium.  pp.55-65,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-25
5.

Conference Proceedings
Conference Proceedings
5. Positron Annihilation Spectroscopy Study of Interfacial Defects Formed by Dissolution of Aluminum in Aqueous Sodium Hydroxide Microscopy
Hebert, K. ; Wu, H. ; Gessmann, T. ; Lynn, K.
Pub. info.: Oxide Films : proceedings of the International Symposium.  pp.167-178,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-4
6.

Conference Proceedings
Conference Proceedings
6. The Use of Phosphoric Acid Immersion to Enhance the Susceptibility of Aluminum to Anodic Pitting Corrosion
Wu, H. ; Hebert, K. ; Gessmann, T. ; Lynn, K.G.
Pub. info.: Oxide Films : proceedings of the International Symposium.  pp.189-197,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-4
7.

Conference Proceedings
Conference Proceedings
7. Study of Positronium in Low-k Dielectric Films by Means of 2D-Angular Correlation Experiments at a High-Intensity Slow-Positron Beam
Gessmann, T. ; Petkov, M.P. ; Weber, M.H. ; Lynn, K.G. ; Rodbell, K.P. ; Asoka-Kumar, P. ; Stoeffl, W. ; Howell, R.H.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.585-587,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
8.

Conference Proceedings
Conference Proceedings
8. Light-emitting diodes with integrated omnidirectionally reflective contacts
Gessmann, T. ; Luo, H. ; Xi, J.-Q. ; Streubel, K.P. ; Schubert, E.F.
Pub. info.: Light-Emitting Diodes: Research, Manufacturing, and Applications VIII.  pp.53-61,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5366