1.

Conference Proceedings

Conference Proceedings
Emanuelsson,P. ; Gehlhoff, W. ; Omling, P. ; Grimmeiss, H.G.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.307-312,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
2.

Conference Proceedings

Conference Proceedings
Gehlhoff, W. ; Rehse, U.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.507-512,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
3.

Conference Proceedings

Conference Proceedings
Hoffmann, A. ; Born, H. ; Naser, A. ; Gehlhoff, W. ; Maffetone, J. ; Perlov, D. ; Ruderman, W. ; Zwieback, I. ; Dietz, N. ; Bachmann, K. J.
Pub. info.: Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.373-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 607
4.

Conference Proceedings

Conference Proceedings
Bagraev, N.T. ; Bouravleuv, A.D. ; Gehlhoff, W. ; Klyachkin, L.E. ; Malyarenko, A.M. ; Mezdrogina, M.M. ; Romanov, V.V. ; Skvortsov, A.P.
Pub. info.: Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering.  pp.73-79,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4627
5.

Conference Proceedings

Conference Proceedings
Kane, M.H. ; Strassburg, M. ; Asghar, A. ; Song, Q. ; Gupta, S. ; Senawiratne, J. ; Hums, C. ; Haboeck, U. ; Hoffmann, A. ; Azamaf, D. ; Gehlhoff, W. ; Dietz, N. ; Zhang, Z.J. ; Summers, C.J. ; Ferguson, I.T.
Pub. info.: Quantum Sensing and Nanophotonic Devices II.  pp.389-400,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5732