1.

Conference Proceedings
Conference Proceedings
1. THERMAL PROPERTY EVOLUTION TOWARD EFFECTIVELY TWO-DIMENSIONAL SUBSTRATE-FREE SYSTEMS
Geer, R. ; Stoebe, T. ; Huang, C. C. ; Pindak, R. ; Goodby, J.
Pub. info.: Macromolecular liquids : symposium held November 27-December 1, 1989, Boston, Massashusetts, U.S.A..  pp.299-304,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 177
2.

Conference Proceedings
Conference Proceedings
2. Interaction forces on mask surfaces relevant to EUV lithography [6349-129]
Hubner, R. ; Eichenlaub, S. ; Rastegar, A. ; Geer, R.
Pub. info.: Photomask Technology 2006.  pp.63493E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
3.

Conference Proceedings
Conference Proceedings
3. Fabrication of cantilever probes with integrated piezoresistive read-out and built-in piezoelectric actuators
Olson, S. ; Altemus, B. ; Sankaran, B. ; Tokranova, N. ; Geer, R. ; Castracane, J. ; Xu, B.
Pub. info.: MEMS/MOEMS Components and Their Applications II.  pp.167-174,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5717
4.

Conference Proceedings
Conference Proceedings
4. Near-field nano-Raman imaging of Si device structures
Atesang, J. ; Geer, R.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.134-140,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5766
5.

Conference Proceedings
Conference Proceedings
5. Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy
Olson, S. ; Sankaran, B. ; Altemus, B. ; Xu, B. ; Geer, R.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.159-167,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5766
6.

Conference Proceedings
Conference Proceedings
6. Nondestructive mechanical imaging of carbon nanotubes
Zheng, Y. ; Sankaran, B. ; Geer, R.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.99-105,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5766