1.

Conference Proceedings
Conference Proceedings
1. ELECTRON-BEAM-INDUCED-CURRENT (EBIC) IMAGING OF DEFECTS IN Si1-XGeX MULTILAYER STRUCTURES
Sturm, J. C. ; Xiao, X. ; Garone, P. M. ; Schwartz, P. V.
Pub. info.: Chemistry and defects in semiconductor heterostructures.  pp.341-346,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 148
2.

Conference Proceedings
Conference Proceedings
2. GROWTH AND DOPING KINETICS OF GeXSi1-X STRUCTURES BY LIMITED REACTION PROCESSING
Garone, P. M. ; Sturm,. J. C. ; Schwartz, P. V. ; Schwarz, S. A. ; Wilkens, B.
Pub. info.: Rapid thermal annealing/chemical vapor deposition and integrated processing : sympoisium held April 25-28, 1989, San Diego, California, U.S.A..  pp.41-46,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 146