1.

Conference Proceedings
Conference Proceedings
1. Retrace error evaluation on a figure-measuring interferometer [5869-35]
Gardner, N. ; Davies, A.
Pub. info.: Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA.  pp.58690V-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5869
2.

Conference Proceedings
Conference Proceedings
2. Traceable radius of curvature measurements on a micro-interferometer
Karodkar, D. ; Gardner, N. ; Bergner, B.C. ; Davies, A.
Pub. info.: Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA.  pp.261-273,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5180
3.

Conference Proceedings
Conference Proceedings
3. Self-calibration for microrefractive lens measurements
Gardner, N. ; Randolph, T. ; Davies, A.
Pub. info.: Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA.  pp.244-252,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5180
4.

Conference Proceedings
Conference Proceedings
4. Electrical Properties And Luminescence Spectra Of Light-Emitting Diodes With InGan/Gan Quantum Wells
Yunovich, A.E. ; Mamakin, S.S. ; Manyakhin, F.I. ; Wattana, A.B. ; Gardner, N. ; Goetz, W. ; Misra, M. ; Stockman, S.
Pub. info.: Materials and devices for optoelectronics and microphotonics : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.71-78,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 722
5.

Conference Proceedings
Conference Proceedings
5. Compact inteferometer for micro-optic performance and shape characterization
Medicus, K. M. ; Karodkar, D. ; Bergner, B. C. ; Gardner, N. ; Davies, A.
Pub. info.: Lithographic and micromachining techniques for optical component fabrication II : 3-4 August 2003, San Diego, California, USA.  pp.85-93,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5183
6.

Conference Proceedings
Conference Proceedings
6. Measurement advances for micro-refractive fabrication (Invited Paper) [5858-25]
Gardner, N. ; Davies, A. ; Bergner, B.
Pub. info.: Nano- and Micro-Metrology.  pp.58580P-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5858
7.

Conference Proceedings
Conference Proceedings
7. Radius case study: optical bench measurement and uncertainty including stage error motions [5879-11]
Schmitz, T. L. ; Gardner, N. ; Vaughn, M. ; Davies, A.
Pub. info.: Recent Developments in Traceable Dimensional Measurements III.  pp.58790B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5879