Xu Y. ; Gao Y. ; Zheng X. ; Wang X. ; Wang T. ; Chen H.
Pub. info.:
ICO20 : optical devices and instruments : 21-26 August, 2005, Changchun, China. pp.602428-602428, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang Z. ; Li S. ; Lu Y. ; Zhao D. ; Liu J. ; Wang L. ; Zhang J. ; Gao Y. ; Wang Z.
Pub. info.:
ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China. pp.60290R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
MIPPR 2005 : Geospatial information, data mining, and applications : 31 October-2 November 2005, Wuhan, China. pp.60452C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhang X. ; Gao Y. ; Chen Z. ; Jia G. ; Liu Y. ; Liu X. ; Zh Y.
Pub. info.:
ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China. pp.602917-602917, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Symposium on Precision Mechanical Measurements. pp.628023-628023, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering