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Conference Proceedings

1. QE reduction due to pixel vignetting in CMOS image sensors

Catrysse,P.B. ; Liu,X. ; Gamal,A.El

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA. pp.420-430, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3965

Conference Proceedings

2. Comparative analysis of SNR for image sensors with enhanced dynamic range

Yang,D.X.D. ; Gamal,A.El

Pub. info.:	Sensors, cameras, and systems for scientific/industrial applications : 25-26 January 1999, San Jose, California. pp.197-211, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3649

Conference Proceedings

3. Analysis of temporal noise in CMOS APS

Tian,H. ; Fowler,B.A. ; Gamal,A.El

Pub. info.:	Sensors, cameras, and systems for scientific/industrial applications : 25-26 January 1999, San Jose, California. pp.177-185, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3649

Conference Proceedings

4. Pixel-level processing:why,what,and how?

Gamal,A.El ; Yang,D. ; Fowler,B.A.

Pub. info.:	Sensors, cameras, and applications for digital photography : 27-28 January 1999, San Jose, California. pp.2-15, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3650

Conference Proceedings

5. Comparative analysis of color architectures for image sensors

Catrysse,P.B. ; Wandell,B.A. ; Gamal,A.El

Pub. info.:	Sensors, cameras, and applications for digital photography : 27-28 January 1999, San Jose, California. pp.26-35, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3650

Conference Proceedings

6. Active pixel sensors fabricated in a standard 0.18-μm CMOS technology

Tian,H. ; Liu,X. ; Lim,S. ; Kleinfelder,S. ; Gamal,A.El

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA. pp.441-449, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4306

Conference Proceedings

7. Photocurrent estimation from multiple nondestructive samples in CMOS image sensor

Liu,X. ; Gamal,A.El

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA. pp.450-458, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4306

Conference Proceedings

8. Analysis of 1/f noise in CMOS APS

Tian,H. ; Gamal,A.El

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA. pp.168-176, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3965

Conference Proceedings

9. Integration of image capture and processing: beyond single-chip digital camera

Lim,S. ; Gamal,A.El

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA. pp.219-226, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4306

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Conference Proceedings

10. Test structures for characterization and comparative analysis of CMOS image sensors

Yang,D.X.D. ; Min,H. ; Fowler,B.A. ; Gamal,A.El ; Beiley,M. ; Cham,K.

Pub. info.:	Advanced focal plane arrays and electronic cameras : 9-10 October 1996, Berlin, FRG. pp.8-17, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2950

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Author: Gamal,A.El