1.

Conference Proceedings

Conference Proceedings
Gallais, L. ; Krol, H. ; Capoulade, J. ; Cathelinaud,M. ; Roussel, L. ; Albrand, G. ; Natoli, J. -Y. ; Commandre, M. ; Lequime, M. ; Amra, C.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.59630Z-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
2.

Conference Proceedings

Conference Proceedings
Krol, H. ; Gallais, L. ; Commandre, M. ; Grezes-Besset, C. ; Torricini, D. ; Lagier, G.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.596311-596311,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
3.

Conference Proceedings

Conference Proceedings
Gallais, L. ; Hinsch, H. ; Lay, M.-L. ; Commandre, M.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.597-602,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
4.

Conference Proceedings

Conference Proceedings
Bertussi, B. ; Natoli, J.-Y. ; During, A. ; Commandre, M. ; Gallais, L. ; Rullier, J.L. ; Bercegol, H. ; Bouchut, P.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.575-580,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
5.

Conference Proceedings

Conference Proceedings
Commandre, M.J. ; Natoli, J.Y. ; Amra, C. ; During, A. ; Gallais, L.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.169-181,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5188
6.

Conference Proceedings

Conference Proceedings
Natoli, J.-Y. ; Bertussi, B. ; Gallais, L. ; Commandre, M. ; Amra, C.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.182-187,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
7.

Conference Proceedings

Conference Proceedings
Gallais, L. ; Voarino, P. ; Natoli, J.-Y. ; Amra, C.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.188-195,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
8.

Conference Proceedings

Conference Proceedings
Krol, H. ; Gallais, L. ; Natoli, J. -Y. ; Grezes-Besset, C. ; Commandre, M.
Pub. info.: Laser-Induced Damage in Optical Materials: 2005.  pp.599129-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5991
9.

Conference Proceedings

Conference Proceedings
Gallais, L. ; Amra, C. ; Natoli, J.-Y.
Pub. info.: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.16-25,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4932
10.

Conference Proceedings

Conference Proceedings
Natoli, J.-Y. ; Gallais, L. ; Bertussi, B. ; Commandre, M. ; Amra, C.
Pub. info.: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.224-237,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4932