Gallais, L. ; Krol, H. ; Capoulade, J. ; Cathelinaud,M. ; Roussel, L. ; Albrand, G. ; Natoli, J. -Y. ; Commandre, M. ; Lequime, M. ; Amra, C.
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Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.59630Z-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Krol, H. ; Gallais, L. ; Commandre, M. ; Grezes-Besset, C. ; Torricini, D. ; Lagier, G.
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Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.596311-596311, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gallais, L. ; Hinsch, H. ; Lay, M.-L. ; Commandre, M.
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Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.597-602, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bertussi, B. ; Natoli, J.-Y. ; During, A. ; Commandre, M. ; Gallais, L. ; Rullier, J.L. ; Bercegol, H. ; Bouchut, P.
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Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.575-580, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Commandre, M.J. ; Natoli, J.Y. ; Amra, C. ; During, A. ; Gallais, L.
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Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA. pp.169-181, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Natoli, J.-Y. ; Bertussi, B. ; Gallais, L. ; Commandre, M. ; Amra, C.
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Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.182-187, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gallais, L. ; Voarino, P. ; Natoli, J.-Y. ; Amra, C.
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Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.188-195, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.16-25, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Natoli, J.-Y. ; Gallais, L. ; Bertussi, B. ; Commandre, M. ; Amra, C.
Pub. info.:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.224-237, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering