1.

Conference Proceedings
Conference Proceedings
1. Nondestructive damage evaluaion of electro-mechanical components using a hybrid, computational and experimental approach
Furlong, C. ; Pryputniewicz, R. J.
Pub. info.: Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.111-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 591
2.

Conference Proceedings
Conference Proceedings
2. Optomechanical characterization of proton-exchange membrane fuel cells
Jalani, N.H. ; Mizar, S.P. ; Choi, P. ; Furlong, C. ; Datta, R.
Pub. info.: Interferometry XII: Applications.  pp.316-325,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5532
3.

Conference Proceedings
Conference Proceedings
3. Novel optoelectronic methodology for testing MOEMS (Invited Paper)
Pryputniewicz, R.J. ; Furlong, C.
Pub. info.: MOEMS and Miniaturized Systems III.  pp.11-25,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4983
4.

Conference Proceedings
Conference Proceedings
4. Sensitivity, accuracy, and precision issues in opto-electronic holography based on fiber optics and high-spatial- and high-digitial-resolution cameras
Furlong, C. ; Yokum, J.S. ; Pryputniewicz, R.J.
Pub. info.: Interferometry XI: Techniques and Analysis.  pp.77-84,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4777
5.

Conference Proceedings
Conference Proceedings
5. Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformation
Furlong, C. ; Pryputniewicz, R.J.
Pub. info.: Interferometry XI: Techniques and Analysis.  pp.271-278,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4777
6.

Conference Proceedings
Conference Proceedings
6. Study and characterization of a MEMS micromirror device
Furlong, C. ; Pryputniewicz, R.J.
Pub. info.: Interferometry XII: Techniques and Analysis.  pp.54-63,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5531
7.

Conference Proceedings
Conference Proceedings
7. Characterization of shape and deformation of MEMS by quantitative optoelectronic metrology techniques
Furlong, C. ; Pryputniewicz, R.J.
Pub. info.: Interferometry XI: Applications.  pp.1-10,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4778
8.

Conference Proceedings
Conference Proceedings
8. Quantitative optical metrology with CMOS cameras (Invited Paper)
Furlong, C. ; Kolenovic, E. ; Ferguson, C.F.
Pub. info.: Interferometry XII: Applications.  pp.1-15,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5532
9.

Conference Proceedings
Conference Proceedings
9. New optoelectronic methodology for nondestructive evaluation of MEMS at the wafer level
Furlong, C. ; Ferguson, C.F. ; Melson, M.J.
Pub. info.: Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology.  pp.69-78,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5265