Fukuzawa, Y. ; Nagasawa, S. ; Watanabe, M. ; Takaoka, S.
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New frontiers of processing and engineering in advanced materials : proceedings of the International Conference on New Frontiers of Process Scinence and Engineering in Advanced Materials : The 14th Iketani Conference, November, 24-26, 2004, held in Kyoto, Japan. pp.443-448, 2005. Zuerich, Switzerland. Trans Tech Publications
Sanpei, H. ; Shima, T. ; Makita, Y. ; Kimura, S. ; Fukuzawa, Y. ; Nakamura, Y. ; Sandhu, A.
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Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.61-, 1998. Warrendale, Pa. MRS - Materials Research Society
Shima, T. ; Makita, Y. ; Kimura, S. ; Sanpei, H. ; Fukuzawa, Y.
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Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.73-, 1998. Warrendale, Pa. MRS - Materials Research Society
Wang, S. ; Otogawa, N. ; Fukuzawa, Y. ; Shen, H. ; Tanoue, H. ; Kojima, T. ; Nakayama, Y. ; Makita, Y.
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Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics. pp.188-195, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering