1.

Conference Proceedings

Conference Proceedings
Yoshizawa, T. ; Fujita, H.
Pub. info.: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.60000H-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6000
2.

Conference Proceedings

Conference Proceedings
Toshlyoshi, H. ; Miyauchi, D. ; Fujita, H.
Pub. info.: Proceedings of the Fifth International Sympposium on Magnetic Materials, Processes, and Devices : applications to storage and microelectromechanical systems (MEMS).  pp.446-472,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-20
3.

Conference Proceedings

Conference Proceedings
Zhou, L. ; Chapuis, Y.-A. ; Blonde, J.-P. ; Bervillier, H. ; Fukuta, Y. ; Fujita, H.
Pub. info.: Smart structures and materials 2004 : modeling, signal processing, and control : 15-18 March 2004, San Diego, California, USA.  pp.498-506,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5383
4.

Conference Proceedings

Conference Proceedings
Houlet, L. ; Reyne, G. ; Iizuka, T. ; Bourouina, T. ; Gergam, E.-D. ; Fujita, H.
Pub. info.: Device and process technologies for MEMS and Microelectronics II : 17-19 December 2001, Adelaide, Australia.  pp.422-427,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4592
5.

Conference Proceedings

Conference Proceedings
Irita, R.T. ; Frere, A.F. ; Fujita, H.
Pub. info.: Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA.  pp.782-791,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4682
6.

Conference Proceedings

Conference Proceedings
BenMoussa, A. ; Tatebayashi, J. ; Gouy, J.-P. ; Fujita, H. ; Arakawa, Y.
Pub. info.: Device and process technologies for MEMS and Microelectronics II : 17-19 December 2001, Adelaide, Australia.  pp.400-405,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4592
7.

Conference Proceedings

Conference Proceedings
Luzzi, D.Z. ; Mori, H. ; Fujita, H. ; Meshii, M.
Pub. info.: Beam-solid interactions and phase transformations : symposium held December 2-4, 1985, Boston, Massachusetts, USA.  pp.479-484,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 51
8.

Conference Proceedings

Conference Proceedings
Fujita, H. ; Hayamizu, N. ; Goshizono, T. ; Sakurai, N.
Pub. info.: Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium.  pp.168-175,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-26
9.

Conference Proceedings

Conference Proceedings
Gouy, J.-P. ; Arakawa, Y. ; Fujita, H.
Pub. info.: Device and process technologies for MEMS and Microelectronics II : 17-19 December 2001, Adelaide, Australia.  pp.292-298,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4592
10.

Conference Proceedings

Conference Proceedings
Reyne, G. ; Houlet, L. ; Takahashi, Y. ; Bourouina, T. ; Fujita, H.
Pub. info.: Device and process technologies for MEMS and Microelectronics II : 17-19 December 2001, Adelaide, Australia.  pp.205-215,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4592