1.

Conference Proceedings
Conference Proceedings
1. Application of Large Magnetocaloric Effects in Itinerant-Electron Metamagnets to Cooling Systems
Fukamichi, K. ; Fujita, A. ; Fujieda, S.
Pub. info.: Advanced structural and functional materials design : proceedings of the International Symposium on Advanced Structural and Functional Materials Design, Osaka, Japan, November 10th-12th, 2004.  pp.137-144,  2006.  Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 512
2.

Conference Proceedings
Conference Proceedings
2. Low Power and High Speed Hf-based Gated CMOS FET with Dual Poly-Si Gate Electrodes (Invited paper)
Iwamoto, T. ; Ogura, T. ; Terai, M. ; Morioka, A. ; Saitoh, M. ; Kimizuka, N. ; Yasuda, Y. ; Imai, K. ; Fujieda, S. ; Watanabe, H.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.143-154,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06
3.

Conference Proceedings
Conference Proceedings
3. Preparation of boron-containing alumina supports by kneading
Dubois, J. L. ; Fujieda, S.
Pub. info.: Preparation of catalysts VI : scientific bases for the preparation of heterogeneous catalysts : proceedings of the Sixth International Symposium, Louvain-la-Neuve, September 5-8, 1994.  pp.833-,  1995.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 91
4.

Conference Proceedings
Conference Proceedings
4. Paramagnetic defects related to positive charges in silicon oxynitride films
Miura, Y. ; Fujieda, S. ; Hasegawa, E.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.263-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
5.

Conference Proceedings
Conference Proceedings
5. Transient Photocurrent Spectroscopy of Trap Levels in Ultra-Thin SiO2 Films
Miura, Y. ; Fujieda, S.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.343-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428