1.

Conference Proceedings

Conference Proceedings
Rothhardt,M. ; Hagemann,V. ; Pohlnann,R. ; Schroter,S. ; Fuchs,H.-J.
Pub. info.: Micro-optical technologies for measurement, sensors, and microsystems II and Optical fiber sensor technologies and applications : 18-20 June 1997, Munich, FRG.  Part 1  pp.231-236,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3099
2.

Conference Proceedings

Conference Proceedings
Glaser,T. ; Schroter,S. ; Bartelt,H. ; Fuchs,H.-J. ; Kley,E.-B.
Pub. info.: Micromachining technology for micro-optics : 20 September 2000, Santa Clara, USA.  pp.158-167,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4179
3.

Conference Proceedings

Conference Proceedings
Kley,E.-B. ; Fuchs,H.-J. ; Zoellner,K.
Pub. info.: Micromachine technology for diffractive and holographic optics : 20-21 September 1999, Santa Clara, California.  pp.71-78,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3879
4.

Conference Proceedings

Conference Proceedings
Duparre,M.R. ; Ludge,B. ; Kowarschik,R.M. ; Golub,M.A. ; Kley,E.-B. ; Fuchs,H.-J.
Pub. info.: Diffractive and holographic optics technology III : 1-2 February, 1996, San Jose, California.  pp.112-119,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2689
5.

Conference Proceedings

Conference Proceedings
Kley,E.-B. ; Fuchs,H.-J. ; Kilian,A.
Pub. info.: Lithographic and Micromachining Techniques for Optical Component Fabrication.  pp.85-92,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4440