1.

Conference Proceedings
Conference Proceedings
1. VACANCY SUPERSATURATION PRODUCED BY HIGH-ENERGY ION IMPLANTATION
Venezia, V.C. ; Eaglesham, D.J. ; Haynes, T.E. ; Agarwal, A. ; Jacobson, D.C. ; Gossmann, H.-J. ; Friessnegg, T. ; Nielsen, B.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.926-937,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
2.

Conference Proceedings
Conference Proceedings
2. Defect Identification in (La,Sr)CoO3-ｦﾄ Using Positron Annihilation Spectroscopy
Friessnegg, T. ; Nielsen, B. ; Ghosh, V. J. ; Moodenbaugh, A. R. ; Madhukar, S. ; Aggarwal, S. ; Keeble, D. J. ; Poindexter, E. H. ; Mascher, P. ; Ramesh, R.
Pub. info.: Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.161-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 541
3.

Conference Proceedings
Conference Proceedings
3. Oxygen deficiency and vacancy formation in LSCO/PLZT/LSCO capacitors
Friessnegg, T. ; Nielsen, B. ; Ghosh, V. J. ; Aggarwal, S. ; Keebel, D. J. ; Poindexter, E. H. ; Ramesh, R.
Pub. info.: Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.393-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 596
4.

Conference Proceedings
Conference Proceedings
4. The Influence of the Incorporation and Desorption of CHn Groups on the Defect Structure of α-SiC:H Films
Friessnegg, T. ; Boudreau, M. ; Mascher, P. ; Simpson, P. J. ; Puff, W.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.667-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
5.

Conference Proceedings
Conference Proceedings
5. Vacancies in Electron Irradiated 6H-SiC
Friessnegg, T. ; Dannefaer, S.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.625-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442