Sandner, T. ; Schmidt, J. U. ; Schnenk, H. ; Lakner, H. ; Yang, M. ; Gatto, A. ; Kaiser, N. ; Braun, S. ; Foltyn, T. ; Leson, A.
Pub. info.:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.596314-596314, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.124-133, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Braun, S. ; Bendjus, B. ; Foltyn, T. ; Menzel, M. ; Schreiber, J. ; Leson, A.
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Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA. pp.75-84, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Braun, S. ; Bendjus, B. ; Foltyn, T. ; Menzel, M. ; Schreiber, J. ; Weissbach, D.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.132-140, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering