1.

Conference Proceedings

Conference Proceedings
Stahle,C.K. ; Bandler,S.R. ; Barbee,T.W.,Jr. ; Beeman,J.W. ; Brekosky,R.P. ; Cabrera,B. ; Cunningham,M. ; Deiker,S. ; Figueroa-Feliciano,E. ; Finkbeiner,F.M. ; Frank,M.A. ; Gendreau,K.C. ; Hilton,C.C. ; Irwin,K.D. ; Labov,S.E. ; Li,M.J. ; Madden,N.W. ; Martinis,J.M. ; McCammon,D.
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.82-93,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3765
2.

Conference Proceedings

Conference Proceedings
Stahle,C.K. ; Brekosky,R.P. ; Figueroa-Feliciano,E. ; Finkbeiner,F.M. ; Gygax,J.D. ; Li,M.J. ; Lindeman,M.A. ; Porter,F.S. ; Tralshawala,N.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.367-375,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
3.

Conference Proceedings

Conference Proceedings
Figueroa-Feliciano,E. ; Stahle,C.K. ; Finkbeiner,F.M. ; Li,M.J. ; Lindeman,M.A. ; Tralshawala,N. ; Stahle,C.M.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.419-427,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
4.

Conference Proceedings

Conference Proceedings
Li,M.J. ; Allen,C.A. ; Aslam,S. ; Chen,T.C. ; Finkbeiner,F.M. ; Gordon,S.A. ; Kuhn,J.L. ; Mott,D.B. ; Stahle,C.M. ; Stahle,C.K. ; Tralshawala,N. ; Wang,L.L.
Pub. info.: Device and process technologies for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia.  pp.192-203,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3892