1.

Conference Proceedings
Conference Proceedings
1. Perfluoropolyethers as novel materials for soft lithography
Reuther, F. ; Kubenz, M. ; Schuster, C. ; Fink, M. ; Vogler, M. ; Gruetzner, G. ; Grimm, J. ; Kaeppel, A.
Pub. info.: Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA.  pp.410-414,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5751
2.

Conference Proceedings
Conference Proceedings
2. Auto-Focalisation. Communication and Sonoluminescence with Acoustic Time Reversal
Fink, M. ; Tourin, A. ; de Rosny, J.
Pub. info.: Wave scattering in complex media : from theory to applications.  pp.257-282,  2003.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 107
3.

Conference Proceedings
Conference Proceedings
3. Digital Communication with Time-Reversal in a Multiple Scattering Medium
Tourin, A. ; Derode, A. ; de Rosny, J. ; Tanter, M. ; Fink, M.
Pub. info.: Wave scattering in complex media : from theory to applications.  pp.597-606,  2003.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 107
4.

Technical Paper
Technical Paper
4. Addressing NASA's Workforce Development Initiatives: Intensifying Outreach and Collaborations
Fink, M. ; Bowen, B. ; Lehrer, H.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Space Conference and Exposition
Ser. no.: 2004
5.

Conference Proceedings
Conference Proceedings
5. Advanced femtosecond DUV laser mask repair tool for large area photomasks [6349-172]
Treyger, L. ; Heyl, J. ; Fink, M. ; Koren, I. ; Li, Y. ; Ronning, D. ; Small, F. ; Xian, B.
Pub. info.: Photomask Technology 2006.  pp.63494G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
6.

Conference Proceedings
Conference Proceedings
6. Reactive polymers: a route to nanoimprint lithography at low temperatures
Pfeiffer, K. ; Reuther, F. ; Carlberg, P. ; Fink, M. ; Gruetzner, G. ; Montelius, L.
Pub. info.: Emerging Lithographic Technologies VII.  1  pp.203-210,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5037
7.

Conference Proceedings
Conference Proceedings
7. Noncontact fluorescence measurements for inspection and imprint depth control in nanoimprint lithography
Finder, Ch. ; Mayer, C. ; Schulz, H. ; Scheer, H.-C. ; Fink, M. ; Pfeiffer, K.
Pub. info.: 18th European Conference on Mask Technology for Integrated Circuits and Microcomponents.  pp.218-223,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4764
8.

Conference Proceedings
Conference Proceedings
8. Performance of 4-in. wafer-scale thermoset working stamps in hot-embossing lithography
Roos, N. ; Schulz, H. ; Fink, M. ; Pfeiffer, K. ; Osenberg, F. ; Scheer, H.-C.
Pub. info.: Emerging Lithographic Technologies VI.  Part One  pp.232-239,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4688
9.

Conference Proceedings
Conference Proceedings
9. Silanized polymeric working stamps for hot embossing lithography
Wissen, M. ; Bogdanski, N. ; Jerzy, R. ; Berrada, Z.E. ; Fink, M. ; Reuther, F. ; Glinsner, T. ; Scheer, H.-C.
Pub. info.: Emerging Lithographic Technologies VIII.  pp.998-1005,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5374