1.

Conference Proceedings
Conference Proceedings
1. The Sn- and Si-DX Centre Properties in Double Doped(Al,Ga)As
Maude,D.K. ; Willke,U. ; Fille,M.L. ; Gibart,P. ; Portal,J.C.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.441-446,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
2.

Conference Proceedings
Conference Proceedings
2. The Ultrasonics-Induced-Quenching of PPC Releated to DX Centers in AlxGa1-x-As
Belyaev,A.E. ; Bardeleben,H.J.von ; Fille,M.L. ; Oborina,E.I. ; Ryabchenko,Yu.S. ; Savchuk,A.U. ; Sheinkman,M.K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1057-1062,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147