Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840L-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Scientific basis for nuclear waste management XVI : symposium held November 30-December 4, 1992, Boston, Mass.. pp.577-582, 1993. Pittsburgh, Pa.. Materials Research Society
Wang, L. ; Chen, B. ; Chen, J. ; Feng, X. ; Lin, Z.
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ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.60280R-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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O’Driscoll, E. J. ; Watson, M. A. ; Delmonte, T. ; Petrovich, M. N. ; Feng, X. ; Flanagan, J. C. ; hayes, J. R. ; Richardson, D. J.
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Technologies for optical countermeasures III : 12-13 September 2006, Stockholm, Sweden. pp.639702-639702, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Digital publishing : 16-17 January, 2006, San Jose, California, USA. pp.60760A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Scientific basis for nuclear waste management XVI : symposium held November 30-December 4, 1992, Boston, Mass.. pp.199-206, 1993. Pittsburgh, Pa.. Materials Research Society
Scientific basis for nuclear waste management XVI : symposium held November 30-December 4, 1992, Boston, Mass.. pp.225-234, 1993. Pittsburgh, Pa.. Materials Research Society
Scientific basis for nuclear waste management XVI : symposium held November 30-December 4, 1992, Boston, Mass.. pp.207-214, 1993. Pittsburgh, Pa.. Materials Research Society
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.744-751, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA. pp.82-89, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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