1.

Conference Proceedings
Conference Proceedings
1. DEFECT-CHARACTERIZATION IN IMPLANTED LOCOS + TRENCH-ISOLATED STRUCTURES
Theodore, N. David ; Vasquez, Barbara ; Fejes, Peter
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.69-74,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
2.

Conference Proceedings
Conference Proceedings
2. THE EFFECT OF TUNGSTEN ON THE NUCLEATION AND GROWTH OF THIN ALUMINUM ALLOY FILMS
Cao, Bea ; Theodore, N. David ; Shin, Hank ; Fejes, Peter ; Hendrickson, Les
Pub. info.: Mechanisms of thin film evolution.  pp.227-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 317
3.

Conference Proceedings
Conference Proceedings
3. Microstructure Analysis of Barium Strontium Titanate Thin Film
Chen, Wei ; Hooker, Joe ; Monarch, Kathy ; Fejes, Peter ; Chu, Peir
Pub. info.: Electron microscopy of semiconducting materials and ULSI devices : symposium held Aprl 15-16, 1998, San Francisco, California, U. S. A..  pp.187-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 523
4.

Conference Proceedings
Conference Proceedings
4. Materials and Physical Properties of Novel High-k and Medium-k Gate Dielectrics
Liu, Ran ; Zollner, Stefan ; Fejes, Peter ; Gregory, Rich ; Lu, Shifeng ; Reid, Kim ; Gilmer, David ; Nguyen, Bich-Yen ; Yu, Zhiyi ; Droopad, Ravi ; Curless, Jay ; Demkov, Alex ; Finder, Jeff ; Eisenbeiser, Kurt
Pub. info.: Gate stack and silicide issues in silicon processing II : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2002.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 670
5.

Conference Proceedings
Conference Proceedings
5. Transmission Electron Microscopic Studies of Strained Si CMOS
Xie, Qianghua ; Fejes, Peter ; Kottke, Mike ; Wang, Xiangdong ; Canonico, Mike ; David, Theodore ; White, Ted ; Sadaka, Mariam ; Vartanian, Victor ; Thean, Aaron ; Nguyen, Bich-Yen ; Barr, Alex ; Thomas, Shawn ; Liu, Ran
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.289-294,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864