1.

Conference Proceedings
Conference Proceedings
1. Phase Separation Kinetics During Drying
Saraf, R. F. ; Ostrander, S. ; Feenstra, R. M.
Pub. info.: Morphological control in multiphase polymer mixtures : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.93-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 461
2.

Conference Proceedings
Conference Proceedings
2. Surface activity of magnesium during GaN molecular beam epitaxial growth
Ramachandran, V. ; Feenstra, R. M. ; Northrup, J. E. ; Greve, D. W.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W3.65.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
3.

Conference Proceedings
Conference Proceedings
3. TEM study of the morphology of GaN/SiC(0001) grown at various temperatures by MBE
Sarney, W. L. ; Salamanca-Riba, L. ; Ramachandran, V. ; Feenstra, R. M. ; Greve, D. W.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W3.47.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
4.

Conference Proceedings
Conference Proceedings
4. Scanning-Tunneling-Microscopy Observation of Surface Reconstruction of GaN on Sapphire and 6H-SiC
Smith, A. R. ; Ramachandran, V. ; Feenstra, R. M. ; Greve, D. W. ; Neugebauer, J. ; Northrup, J. E. ; Shin, M. ; Skowronski, M.
Pub. info.: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.363-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 482
5.

Conference Proceedings
Conference Proceedings
5. Scanning Tunneling Microscopy Studies of InGaN Growth by Molecular Beam Epitaxy
Chen, H. ; Smith, A. R. ; Feenstra, R. M. ; Greve, D. W. ; Northrup, J. E.
Pub. info.: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G9.5.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 537
6.

Conference Proceedings
Conference Proceedings
6. ROUGHNESS ANALYSIS OF Si1-xGex FILMS
Feenstra, R. M. ; Lutz, M. A. ; Copel, M.
Pub. info.: Evolution of thin film and surface structure and morphology : symposium held November 28-December 2, 1994, Boston, Massachusetts, USA.  pp.301-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 355
7.

Conference Proceedings
Conference Proceedings
7. Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)
Hartman, J. D. ; Naniwae, K. ; Petrich, C. ; Ramachandran, V. ; Feenstra, R. M. ; Nemanich, R. J. ; Davis, R. F.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.353-356,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
8.

Conference Proceedings
Conference Proceedings
8. CROSS-SECTIONAL SCANNING TUNNELING MICROSCOPY OF III-V SEMICONDUCTOR STRUCTURES
Feenstra, R. M. ; Vaterlaus, A. ; Woodall, J. M. ; Collins, D. A. ; McGill, T. C.
Pub. info.: Determining nanoscale physical properties of materials by microscopy and spectroscopy.  pp.15-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 332
9.

Conference Proceedings
Conference Proceedings
9. Characterization of GaN epitaxial films grown on SiNx and TiNx porous network templates (Invited Paper) [6121-11]
Xie, J. ; Fu, Y. ; Ozgur, U. ; Moon, Y. T. ; Yun, F. ; Morkoc, H. ; Everitt, H. O. ; Sagar, A. ; Feenstra, R. M. ; Inoki, C. K. ; Kuan, T. S. ; Zhou, L ; Smith D. J
Pub. info.: Gallium Nitride Materials and Devices.  pp.61210B-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6121