1.

Conference Proceedings
Conference Proceedings
1. An X-Ray Sensitive CCD Camera System and its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy
Fandrich,F. ; Kohler,R.
Pub. info.: Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995.  pp.219-226,  1996.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 210-213
2.

Conference Proceedings
Conference Proceedings
2. Mapping in Real and Reciprocal Space
Wroblewski,T. ; Breuer,D. ; Crostack,H.-A. ; Fandrich,F. ; Gross,M. ; Klimanek,P.
Pub. info.: EPDIC 5 : proceedings of the Fifth European Powder Diffraction Conference, held May 25-28, 1997 in Parma, Italy.  Part1  pp.216-220,  1998.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 278-281