1.

Conference Proceedings
Conference Proceedings
1. The scanning infra-red microscope: An alternative tool to measure bulk micro-defect density in semiconductors
Mule'Stagno, L. ; Bazzali, A. ; Olmo, M. ; Toeroek, P. ; Faister, R. ; Fraundorf, P.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.431-437,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. Dislocation Locking by Oxygen in Silicon: New Insights to Oxygen Difflision at Low Temperatures*
Sendaker, S. ; Giannattosio, A. ; Faister, R. ; Wilshaw, P.R.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.171-182,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20