Geoinformatics 2007, Geospatial information science : 25-27 May 2007, Nanjing, China. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Energy and Environmental Materials II : Selected, peer reviewed papers from the Chinese Materials Congress 2014 (CMC 2014), July 4-7, 2014, Chengdu, China. pp.268-272, 2015. Aedermannsdorf, Switzerland. Trans Tech Publications
Geoinformatics 2006 : GNSS and integrated geospatial applications : 28-29 October 2006, Wuhan, China. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical transmission, switching, and subsystems VI. 2 pp.71363F-1-71363F-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. 2 pp.72834B-1-72834B-5, 2009. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Nanostructured thin films : 13-14 August 2008, San Diego, California, USA. pp.704107-1-704107-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic technology and instruments, control theory and automation, and space exploration : Seventh International Symposium on Instrumentation and Control Technology : 10-13 October 2008, Beijing, China. pp.71291D-1-71291D-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering