1.

Conference Proceedings
Conference Proceedings
1. Evaluation of ultra-thin double gate MOSFETs for the 45 nm technology node
Barin, N. ; Fiegna, C. ; Esseni, D. ; Sangiorgi, E.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.45-50,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
2.

Conference Proceedings
Conference Proceedings
2. Measurements of Low Field Mobility in Ultre-Thin SOI n- and p-Mosfets
Mastrapasqua, M. ; Esseni, D. ; Celler, G.K. ; Baumann, F.H. ; Fiegna, C. ; Selmi, L. ; Sangiorgi, E.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.97-102,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3