1.

Conference Proceedings
Conference Proceedings
1. Improvement of thickness uniformity of quartz crystal wafer by numerically controlled plasma CVM [5869-17]
Shibahara, M. ; Yamamura, K. ; Sano, Y. ; Sugiyama, T. ; Endo, K. ; Mori, Y.
Pub. info.: Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA.  pp.58690I-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5869
2.

Conference Proceedings
Conference Proceedings
2. Intrinsic Josephson Junctions on High-Quality BSCCO-2212/2223 Superlattice Thin Films Grown by MOCVD
Endo, K. ; Sato, H. ; Yoshizawa, T. ; Abe, K. ; Itoh, J. ; Kajimura, K. ; Akoh, H.
Pub. info.: Materials for high-temperature superconductor technologies : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A..  pp.169-174,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 689
3.

Conference Proceedings
Conference Proceedings
3. Positive ArF resist with 2EAdMA/GBLMA resin system
Uetani, Y. ; Fujishima, H. ; Araki, K. ; Endo, K. ; Takemoto, I..
Pub. info.: Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California.  pp.510-517,  1999.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3678
4.

Conference Proceedings
Conference Proceedings
4. Airport pavement roughness evaluation based on aircraft response
Dong, Q. ; Hachiya, Y. ; Endo, K. ; Himeno, K. ; Kawamura, A. ; Matsui, K.
Pub. info.: Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA.  pp.118-126,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5394
5.

Conference Proceedings
Conference Proceedings
5. Development of a figure correction method having spatial resolution close to 0.1 mm
Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA.  pp.105-111,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5193
6.

Conference Proceedings
Conference Proceedings
6. Demonstration Experiment on Continuous Uranium Metal Production System by Molten Salt Electrolysis
Teramae, N. ; Takasawa, Y. ; Onoue, T. ; Hoshino, Y. ; Endo, K. ; Ota, K. ; Tsuchiya, H. ; Udea, H. ; Kida, Y. ; Kouda, K.
Pub. info.: Proceedings of the eleventh International Symposium on Molton [i.e. Molten] Salts XI.  pp.170-179,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-11
7.

Conference Proceedings
Conference Proceedings
7. Fabrication technology of hard x-ray aspherical mirror optics and application to nanospectroscopy
Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Shimura, M. ; Ishizaka, Y.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA.  pp.11-17,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5193
8.

Conference Proceedings
Conference Proceedings
8. New growth method of high-quality multicomponent oxide thin films used in strongly correlated electron device applications: impurity-precipitate issues and their problem solving [5932-35]
Endo, K. ; Badica, P. ; Sato, H. ; Akoh, H.
Pub. info.: Strongly correlated electron materials : physics and nanoengineering : 31 July-4 August, 2005, San Diego, California, USA.  pp.593211-593212,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5932
9.

Conference Proceedings
Conference Proceedings
9. Hard x-ray nano-focusing of 40nm level using K-B mirror optics for nanoscopy/spectroscopy [5918-05]
Matsuyama, S. ; Mimura, H. ; Yumoto, H. ; Hara, H. ; Yamamura, K. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Tshikawa, T. ; Yamauchi, K.
Pub. info.: Laser-generated, synchrotron, and other laboratory X-ray and EUV sources, optics, and applications II : 2-4 August 2005, San Diego, California, USA.  pp.591804-591804,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5918
10.

Conference Proceedings
Conference Proceedings
10. PHOTOEMISSION STUDY OF Si(001) SURFACES EXPOSED TO As FLUX
Okumura, H. ; Miki, K. ; Sakamoto, K. ; Sakamoto, T. ; Misawa, S. ; Endo, K. ; Yoshita, S.
Pub. info.: Chemistry and defects in semiconductor heterostructures.  pp.285-290,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 148