1.

Conference Proceedings
Conference Proceedings
1. Theory of Oxide Defects Near The Silicon-Silicon Dioxide Interface
Fowler, W.B. ; Chu, A.X. ; Snyder, K.C. ; Edwards, A.H.
Pub. info.: Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.13-22,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-16
2.

Conference Proceedings
Conference Proceedings
2. The Pb1 Center at the Si-SiO2 Interface: Updated Evidence and Emerging Models
Stahis, J.H. ; Cartier, E. ; Edwards, A.H. ; Poindexter, E.H.
Pub. info.: Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.259-274,  1997.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-10