Wegscheider, Werner ; Eberl, Karl ; Abstreiter, Gerhard ; Cerva, hans ; Oppolzer, Helmut
Pub. info.:
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA. pp.155-160, 1990. Pittsburgh, Pa.. Materials Research Society
Zollner, Stefan ; Herzinger, Craig M. ; Woollam, John A. ; Iyer, Subramanian S. ; Powell, Adrian P. ; Eberl, Karl
Pub. info.:
Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A.. pp.205-, 1995. Pittsburgh, PA. MRS - Materials Research Society