1.

Conference Proceedings
Conference Proceedings
1. ISLAND FORMATION IN Ge ON Si HETEROEPITAXY
Eaglesham, D. J. ; Cossmann, H.-J. ; Cerullo, M.
Pub. info.: Epitaxial heterostructures : symposium held April 16-19, 1990, San Francisco, California, U.S.A..  pp.51-56,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 198
2.

Conference Proceedings
Conference Proceedings
2. THE NUCLEATION AND PROPAGATION OF MISFIT DISLOCATIONS NEAR THE CRITICAL THICKNESS IN Ge-Si STRAINED EPILAYERS
Kvam, E. P. ; Eaglesham, D. J. ; Maher, D. M. ; Humphreys, C. J. ; Bean, J. C. ; Green, G. S. ; Tanner, B. K.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.623-628,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings
Conference Proceedings
3. MICROSTRUCTURE AND ELECTROMIGRATION PROPERTIES OF SUBMICRON Al(.5%Cu) LINES
Prybyla, J. A. ; Kola, R. R. ; Hull, R. ; Eaglesham, D. J. ; Huggins, H. A.
Pub. info.: Mechanisms of thin film evolution.  pp.219-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 317
4.

Conference Proceedings
Conference Proceedings
4. Atomistic Model of Transient-Enhanced Diffusion and Clustering of Boron in Silicon
Pelaz, L. ; Gilmer, G. H. ; Jaraiz, M. ; Gossmann, H-J. ; Rafferty, C. S. ; Eaglesham, D. J. ; Poate, J. M.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.341-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
5.

Conference Proceedings
Conference Proceedings
5. Enhanced Diffusion of Dopants in Vacancy Supersaturation Produced by MeV Implantation
Venezia, V. C. ; Haynes, T. E. ; Agarwal, A. ; Gossmann, H-J. ; Eaglesham, D. J.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.303-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
6.

Conference Proceedings
Conference Proceedings
6. The Effect of the Extra Ion on Residual Damage in MeV-Implanted Si
Libertino, S. ; Benton, J. L. ; Coffa, S. ; Jacobson, D. C. ; Eaglesham, D. J. ; Poate, J. M. ; Lavalle, M. ; Fuochi, P. G.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.187-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
7.

Conference Proceedings
Conference Proceedings
7. Impact of Metal Contamination of 7.0 nm Gate Oxides on Various Substrate Materials
Saito, S. ; Hamada, K. ; Eaglesham, D. J. ; Shiramizu, Y. ; Benton, J. L. ; Kitajima, H. ; Jacobson, S. D. C. ; Poate, J. M.
Pub. info.: Science and technology of semiconductor surface preparation : symposium held April 1-3, 1997, San Francisco, California, U.S.A..  pp.81-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 477
8.

Conference Proceedings
Conference Proceedings
8. CoSi2/Si(111) INTERFACE STRUCTURE AND ITS INFLUENCE ON THE SCHOTTKY BARRIER
Sullivan, J. P. ; Graham, W. R. ; Schrey, F. ; Eaglesham, D. J. ; Kola, R. ; Tung, R. T.
Pub. info.: Silicides, germanides, and their interfaces : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.249-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 320
9.

Conference Proceedings
Conference Proceedings
9. Characterization of Interstitial Defect Clusters in Ion-Implanted Si
Benton, J. L. ; Libertino, S. ; Coffa, S. ; Eaglesham, D. J.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.193-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
10.

Conference Proceedings
Conference Proceedings
10. UNDERSTANDING AND CONTROLLING TRANSIENT ENHANCED DOPANT DIFFUSION IN SILICON
Stolk, P. A. ; Gossmann, H.-J. ; Eaglesham, D. J. ; Jacobson, D. C. ; Luftman, H. S. ; Poate, J. M.
Pub. info.: Beam-solid interactions for materials synthesis and characterization : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.307-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 354