Dyer, J.S. ; Brown, s. ; Esplin, R.W. ; Hansen, G. ; Jensen, S.M. ; Stauder, J.L. ; Zollinger, L.
Pub. info.:
Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA. pp.8-18, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gamble, L. ; Dennison, J.R. ; Wood, B.E. ; Herrick, J. ; Dyer, J.S.
Pub. info.:
Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA. pp.111-118, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA. pp.251-261, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Current developments in lens design and optical engineering III : 8-9 July 2002, Seattle, USA. pp.70-78, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Creely, C.M. ; Kelly, J.M. ; Feeney, M.M. ; Hudson, S. ; Penedo, J.C. ; Blau, W.J. ; Elias, B. ; Kirsch-De Mesmaeker, A. ; Matousek, P. ; Towrie, M. ; Parker, A.W. ; Dyer, J.S. ; Gerorge, M.W. ; Coates, C.G. ; McGavey, J.J.
Pub. info.:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications. Part One pp.92-102, 2003. Belliengham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering